Power & Temperature Cycling
EquipmentPower Temperature Cycling (PTC)
HITACHI / EC-25EXTH
Introduction
A test that evaluates the impact of low temperature and high temperature environment on powered electronic products
Application
Products such as power semiconductors that overheat even when normally operating, are evaluated based on the temperature cycle and other operational elements, and the worst case operation is used to evaluate operational reliability.
The Equipment
Power Temperature Cycling (PTC)
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Test Method
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While the test uses the same chamber used in a typical temperature cycle equipment, the test uses a combination of power supplies capable of supplying specific voltage and current to the product. The chamber creates a temperature profile, and the power supply emphasises stress by turning it on for 5 minutes and turning it off for 5 minutes.
DATA EXAMPLE
High temperature and low temperature is maintained for is 10 minutes, temperature is changed within 20 to 30 minutes, and the maximum minimum temperature is set according to the product's operating temperature.
Technical Use Case
Related Standards
- JESD22-A105