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Compared to optical microscopes that can only observe x2000 magnifications, the Scanning electron microscopes (SEM) can observe samples using x800,000 magnifications, so SEMs are widely used for sample surface observation. The device that can be also be used for x10-100 low-magnification observation. While the field of vision is narrow at high magnification, it is wider for lower magnifications, which is often useful for grasping the entire sample. SEM is an analytical device that measures the height of the sample by detecting and amplifying secondary electrons emitted from the sample surface when electron beam are shot onto the sample surface. At this point, the components of the observed sample can be analysed using the Energy Dispersive X-ray Spectroscopy (EDS) installed in the SEM equipment.

Surface Analysis, Failure Analysis : Package, Die, PCB, SMT Level , Reverse Engineering, Voltage contrast imaging analysis, Size Measurement, EDS analysis