FIB-SEM
EquipmentDual Beam Focused Ion Beam
Using the Dual Beam FIB, you can etch the fine areas of the sample into a desired shape and obtain highresolution image information.
Introduction
The Dual Beam FIB is equipped with a FIB column and a SEM column, so it was developed specifically for fine milling cross section. The FIB can etch fine areas by shooting ion beams, and the SEM column can observe high-resolution images. Because the FIB and SEM columns are mounted together inside the chamber, image observation and etching can be conducted simultaneously, making it a time effective device. In addition, the analysis is carried out in a In-situ state to prevent contamination that may occur in the area observed.
Application
Cross section image analysis, Cross section size analysis
The Equipment
QRT FIB/TEM Portfolio Overview
FIB Specifications
Hydra FIB Specification
Technical Use Case
Cross section – Imaging, Size analysis
Contact Point
Person in charge- • TEL.
- 031-546-7555
- • E-mail.
- kwonhyeong.lee@qrtkr.com