Soft Error Evaluation Equipment
- 01.
- Radiation-induced soft errors in semiconductors are caused by high-energy particles.
- 02.
- The particles produce different Single Event Effects (SEE) on each device type.
- 03.
- Soft errors may cause property damage and personal injury.
- 04.
- ISO 26262 STD requires a soft error test to ensure the Functional Safety of the vehicle.
- 05.
- Our SEE Analysis System helps you to perform a Certification Test at various beam facilities per Standards.
- 06.
- The System has advanced test and analysis functions to meet demanding test needs.
Advantage Differentiation: What is different about SEE System?
