QRT LTS-RF (Lifetime Test System for RF Device)
- 01.
- As 5G communication is increasingly used in various fields, communication loss may lead to emergencies.
- 02.
- The lifetime prediction of the communication device and products are essential.
- 03.
- There are two types of reliability tests for lifetime prediction: HTOL (High-Temperature Operating Life-test) and ALT (Accelerated Life Test).
- 04.
- Applying RF (Radio Frequency) Stress is essential during life tests to simulate the actual operating conditions of the device.
- 05.
- Reports show that the Operating Life of the RF Device is more extended than actual if the test is conducted without RF Stress. Furthermore, the findings demonstrate degradation mechanism of the RF device is different when RF Stress is applied.
- 06.
- JEP-118, JESD-226, and JESD-237 are the JEDEC standards for RF Device Life Tests.
- 07.
- Our RF Analysis System makes RF Stress-based life tests more straightforward and efficient than traditional methods. Most importantly, it saves you time and money for your next RF HTOL.
Device Qualification Requirements
| Type | Stress | Standard Reference |
Abbr | Test Conditions | Requirements | |
|---|---|---|---|---|---|---|
| # of lots / Sample Size per lot |
Duration / Acceptance |
|||||
| Type | RF Biased Life Test | JESD226 | RFBL | Tj≥125℃ | 3 lots / 76 units | 1000 hrs / 0 fail |
International Standard : JESD226