HTOL, LTOL
EquipmentHigh Temperature Operating Life Test (HTOL),
Early Life Failure Rate
MCC/ LC-2
HTOL, Early Life Failure Rate
Introduction
Calculating semiconductor operating life time, JESD 47, AEC-Q specification certification items, predicting defect rate during initial life span after product shipment, and calculating burin-time stress
Application
The HTOL/LTOL test was developed to predict the life of a semiconductor, and has since been used as a criteria used to verify that the products operates normally under 1000 hours (about 10 years in user environment)of exposure to stress.
The Equipment
High Temperature Operating Life Test (HTOL, Early Life Failure Rate)
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- Manufacturer / Model
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MCC/ LC-2
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- USE
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Calculatng Semiconductor Operating Lifetime
JESD 47, AEC-Q Spec Verification Criteria
Predicting Defect Rate of Just Released Products
Burin-Time Stress Calculation
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- Equipment Spec
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Temperature Range: 25 ~ 150 ℃
Channel : 256
Vector Depth : 8M
Test Method
The time distribution for defective semiconductor components is typically expressed as a "bathtub" curve. The curve consists of three different components: a rapidly decreasing "infant mortality", a stable and practical part of life (i.e., a continuous decline in the rate of failure or a very constant part), and an increasing rate of failure due to wear-out characteristics. Early Life Failure Rate (ELFR) is used to evaluate the defect rate of the Infant Mortality section, and HTOL (High Temperature Operating Life) is used to evaluate the quality from actual use period to wear failure. HTOL testing is used as an essential item in terms of semiconductor reliability, and usually requires a lifespan of more than 10 years.
DATA EXAMPLE
Technical Use Case
Related Standards
- JESD22-A108
- JESD47
- AEC-Q100