Latch-up Test
EquipmentLatch-up Test
MK2.SE / Thermo Fisher Scientific, MK4.TE / Thermo Fisher Scientific
Introduction
Latch-up test: A device such as CMOS inevitably forms a p-n-p-n structure, and a parasitic Thyristor formed by this structure operates on some electrical effect that amplifies the current and destroys the device. The Latch-up is a test that models this phenomenon.
Application
Semiconductor(Memory, System IC), Discrete IC, Passive Component Level ESD(HBM, MM) Test
Semiconductor(Memory, System IC) Level Latch-up Test
Auto IV curve & Spot Measurement
The Equipment
Latch-up Test Equipment
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- Equipment
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Test Pin count : 2304(MK4), 768(MK2)
Latch-up Vector : 256k depth/20MHz(MK4),
64k depth/10MHz(MK2)Power Supplies : 8 separate V/I(MK4),
6 separate V/I(MK2)
Technical Use Case
Related Standard
Items |
Consumer / Industrial |
Automotive |
|---|---|---|
Latch-up |
JESD78E |
• AEC-Q100-004 |
Contact Point
Person in charge
Dongsung Kim
Senior Engineer
Senior Engineer
- • TEL.
- +82-31-546-7549
- • E-mail.
- dongsung.kim@qrtkr.com