RF High Temperature Operating Life Test
EquipmentRF High Temperature Operating Life Test
QRT supports RF accreditation testing at various frequencies and powers by using a high output amplifier.
Introduction
About the Test
In general, a lifetime test of a semiconductor is a HTOL (JESD22-A108) test that operates the product in a high temperature environment. While ordinary semiconductor products operate using electrical signals, RF products use RF signals as input for operation. QRT supports RF accreditation testing at various frequencies and powers by using a high output amplifier. Further more, through the chip operation experts consulting, dynamic operating conditions can be simulated and the chip's status can be monitored real time.
In addition to stress tests, key RF specifications can be measured directly to immediately determine whether the evaluation of the product is a Pass or Fail.
RF –Measurement Item
- S-parameter analysis
- S-parameter is the ratio of the input voltage to the output voltage on the frequency distribution. QRT measures the S-parameter under various conditions by running the automatic control program.
- IP3
- We measure IM3 components generated by signals above TWOTONE as well as the IP3, which is a virtual power point that equals the fundamental signal power.
- P1dB, P3dB
- The amplifier's maximum linear output of 1dB gain compression point and the accumulated power of P3dB are measured more accurately using the automatic control program.
- Noise Figure
- Noise Index (NF) is an indicator of how much noise has been added as a signal passes through a system or circuit block. More accurate testing can be conducted using high-performance instruments.
